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PDF) Test Embedding with Discrete Logarithms
PDF) Test Embedding with Discrete Logarithms

PDF) On the Generation of Functional Test Programs for the Cache  Replacement Logic
PDF) On the Generation of Functional Test Programs for the Cache Replacement Logic

PDF) A Low-Cost BIST Scheme for Test Vector Embedding in  Accumulator-Generated Sequences
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences

IVML > People > Phivos Mylonas
IVML > People > Phivos Mylonas

PDF) Multimode scan: Test per clock BIST for IP cores
PDF) Multimode scan: Test per clock BIST for IP cores

PDF) A Low-Cost BIST Scheme for Test Vector Embedding in  Accumulator-Generated Sequences
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences

PDF) A domain-specific approach for software development on Manycore  platforms
PDF) A domain-specific approach for software development on Manycore platforms

PDF) Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating  Technique
PDF) Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique

Education and Information Technologies | Home
Education and Information Technologies | Home

NiDS2022 (Novel & Intelligent Digital Systems) - ATHENS
NiDS2022 (Novel & Intelligent Digital Systems) - ATHENS

PDF) Moduli Set Selection and Cost Estimation for RNS-Based FIR Filter and  Filter Bank Design
PDF) Moduli Set Selection and Cost Estimation for RNS-Based FIR Filter and Filter Bank Design

PDF) Survival analysis for modeling critical events that communities may  undergo in dynamic social networks
PDF) Survival analysis for modeling critical events that communities may undergo in dynamic social networks

PDF) UHF Receiver Front-End: Implementation and Analog Baseband Design  Considerations
PDF) UHF Receiver Front-End: Implementation and Analog Baseband Design Considerations

PDF) A Low-Cost BIST Scheme for Test Vector Embedding in  Accumulator-Generated Sequences
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences

PDF) High-Level Test Synthesis for Delay Fault Testability
PDF) High-Level Test Synthesis for Delay Fault Testability

Education and Information Technologies | Home
Education and Information Technologies | Home

PDF) Concurrent Self-Test with Partially Specified Patterns For Low Test  Latency and Overhead
PDF) Concurrent Self-Test with Partially Specified Patterns For Low Test Latency and Overhead

ERCIM News 96 by Peter Kunz - Issuu
ERCIM News 96 by Peter Kunz - Issuu

PDF) Extending Internet into Space – ESA DTN Testbed Implementation and  Evaluation
PDF) Extending Internet into Space – ESA DTN Testbed Implementation and Evaluation

PDF) Detection of Delay Faults in Memory Address Decoders
PDF) Detection of Delay Faults in Memory Address Decoders

PDF) Accumulator-Based Weighted Pattern Generation.
PDF) Accumulator-Based Weighted Pattern Generation.

Latest Award Winners
Latest Award Winners

PDF) On the generation of pseudo-deterministic two-patterns test sequence  with LFSRs.
PDF) On the generation of pseudo-deterministic two-patterns test sequence with LFSRs.

PDF) Efficient Test Compaction for Pseudo-Random Testing
PDF) Efficient Test Compaction for Pseudo-Random Testing

PDF) Memory testing with a RISC microcontroller
PDF) Memory testing with a RISC microcontroller